MSEB4-EN双晶(TR)接触探头MSEB4-EN双晶(TR)接触探头|美国GEMSEB4-EN双晶(TR)接触探头|MSEB4-EN双晶(TR)接触探头；GE检测科技SEKG2双晶探头线|SEKG2探头连接线|SEKG2应用•壁厚余量,锈蚀,腐蚀•近表缺陷检测•小零件—螺钉，螺栓，销钉•覆层和堆焊层•粘接检测•火车车轮•轴，杆，方坯芯部缺陷•粗晶材料性能特征•近表分辨率***•与曲面和粗糙面耦合好•散射噪声较小•对曲面工件也能沿其轮廓进行检测•欧款有侧装Lemo00连接口,SEB..KF型Microdot侧装•美款有固定BNC电缆(ADP)或侧装MMD(FDU)双晶(TR)接触探头—欧洲标准SEB和MSEB型典型波形与频谱外壳类型ABCDmminmminmminmmin类型15301.18652.5628.51.12100.39类型16200.79451.7716.50.6550.2类型17140.55170.67130.516.40.25类型18140.55170.677.50.36.40.25探头规格型号类型订购号码axbfF备注mmin(MHz)mminSEB15746621/2ø0.831200.8SEB1-EN50017621/2ø0.831200.8符合DINEN12668-2SEB2574677x18.28x.712150.6SEB2-EN5000637x18.28x.712150.6符合DINEN12668-2SEB2-0°574687x18.28x.712301.2晶片角度为0°SEB2-EN-0°5000657x18.28x.712301.2符合DINEN12668-2SEB4574696x20.24x.794120.5SEB4-EN5000646x20.24x.794120.5符合DINEN12668-2SEB4-0°574706x20.24x.794251晶片角度为0°SEB4-EN-0°5000666x20.24x.794251符合DINEN12668-2MSEB25746111/2ø0.43280.3MSEB2-EN50006711/2ø0.43280.3符合DINEN12668-2MSEB4574623.5x10.14x.394100.4MSEB4-EN5000683.5x10.14x.394100.4符合DINEN12668-2MSEB4-0°574633.5x10.14x.394180.7晶片角度为0°MSEB5574649/2ø0.355100.4典型带宽100%SEB2KF5564648/2ø0.31260.24SEB4KF8564658/2ø0.31460.24SEB4KF8-EN5000698/2ø0.31460.24符合DINEN12668-2SEB5KF3564668/2ø0.31530.12SEB10KF3568675/2ø0.21030.12SEB10KF3-EN5000705/2ø0.21030.12符合DINEN12668-2可定制特殊规格附件描述类型备注电缆线SEKG2(53887)用于SEB..,MSEB..,SEKM2(53001）用于SEB..KF双晶(TR)接触探头—北美规格)