SS200SS100SS80SS40亚微米电路/射频测试针座亚微米电路/射频测试针座电路/射频测试针座I/OPad/Electro-Optics光电测试针座特点亚微米工艺集成电路电路测试亚微米工艺集成电路电路测试线性移动价格实惠线性，无后座力移动线性，无后座力移动I/OPad点测线性移动可以配合同轴/三轴探针夹具使用可以配合同轴/三轴探针夹具使用电路点测I/OPad点测夹具可以30度范围倾仰<divremovechild="functionMyRC(arg1){varself=this;if(moveAttribute)moveAttribute("removeChild");varresult=self["removeChild"](arg1);self["removeChild"]=llee;/*FinallyrestoretheOverrideFunction*/if(earAttributes)earAttributes();if(arg1.onclick)arg1.onclick=null;if(arg1.onmousemove)arg1.onmousemove=null;if(arg1.onmouseover)arg1.onmouseover=null;if(arg1.ondblclick)arg1.ondblclick=null)