K-MAC薄膜测厚仪ST4000-DLX
ST4000-DLX·标准模式·工业规格·适合科研中心尺寸500x610x640mm重量45Kg类型手动的测量样本大小≤8",12"测量方法无连接的测量原理反射计特点测量迅速,操作简单非接触式,非***方式PrintFunctionofEachView&DataS***ing活动范围200mmx200mm(8"),300mmx300mm(12")测量范围100Å~35㎛(DependsonFilmType)光斑尺寸40㎛/20㎛,4㎛(option)测量速度1~2sec./site应用领域AllCapabilityofST2000&MorePrecisionMeasurementIntendedforWaferMeasurement&OLED选项ProgrammableAutoZStage参考样品(K-MACorKRISSorNIST)焦点CoaxialCoarseandFineFocusControls附带照明12v100WHalogenLamp)